Light Detection using an Aperture

ABSTRACT

The present disclosure relates to limitation of noise on light detectors using an aperture. One example implementation includes a system. The system includes a lens disposed relative to a scene. The lens focuses light from the scene. The system also includes an aperture defined within an opaque material. The system also includes a waveguide having a first side that receives light focused by the lens and transmitted through the aperture. The waveguide guides the received light toward a second side of the waveguide opposite to the first side. The waveguide has a third side extending between the first side and the second side. The system also includes an array of light detectors that intercepts and detects light propagating out of the third side of the waveguide.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.No. 15/368,579, filed Dec. 3, 2016, which is incorporated herein byreference.

BACKGROUND

Unless otherwise indicated herein, the materials described in thissection are not prior art to the claims in this application and are notadmitted to be prior art by inclusion in this section.

Light detectors, such as photodiodes, single photon avalanche diodes(SPADs), or other types of avalanche photodiodes (APDs), can be used todetect light that is imparted on their surfaces (e.g., by outputting anelectrical signal, such as a voltage or a current, corresponding to anintensity of the light). Many types of such devices are fabricated outof semiconducting materials, such as silicon. In order to detect lightover a substantial geometric area, multiple light detectors can bearranged into arrays connected in parallel. These arrays are sometimesreferred to as silicon photomultipliers (SiPMs) or multi-pixel photoncounters (MPPCs).

Some of the above arrangements are sensitive to relatively lowintensities of light, thereby enhancing their detection qualities.However, this can lead to the above arrangements also beingdisproportionately susceptible to adverse background effects (e.g.,extraneous light from outside sources could affect a measurement by thelight detectors).

SUMMARY

In one example, a system includes a lens disposed relative to a sceneand configured to focus light from the scene. The system also includesan aperture defined within an opaque material. The system also includesa waveguide having a first side that receives light focused by the lensand transmitted through the aperture. The waveguide guides the receivedlight toward a second side of the waveguide opposite to the first side.The waveguide has a third side extending between the first side and thesecond side. The system also includes an array of light detectors thatintercepts and detects light propagating out of the third side of thewaveguide.

In another example, a method involves focusing, via a lens disposedrelative to a scene, light from the scene. The method also involvestransmitting the focused light through an aperture defined within anopaque material. The method also involves receiving, at a first side ofa waveguide, light transmitted through the aperture. The method alsoinvolves guiding, by the waveguide, the received light toward a secondside of the waveguide. The method also involves detecting, at an arrayof light detectors, light propagating out of a third side of thewaveguide. The third side extends between the first side and the secondside.

In yet another example, a light detection and ranging (LIDAR) deviceincludes a LIDAR transmitter that illuminates a scene. The LIDAR devicealso includes a LIDAR receiver that receives light scattered by one ormore objects within the scene. The LIDAR receiver includes a lens thatfocuses the scattered light. The LIDAR receiver also includes anaperture defined within an opaque material. The LIDAR receiver alsoincludes a waveguide having a first side that receives light focused bythe lens and transmitted through the aperture. The waveguide guides thereceived light toward a second side of the waveguide opposite to thefirst side. The waveguide has a third side extending between the firstside and the second side. The LIDAR receiver also includes an array oflight detectors that intercepts and detects light propagating out of thethird side of the waveguide.

In still another example, a system comprises means for focusing, via alens disposed relative to a scene, light from the scene. The system alsocomprises means for transmitting the focused light through an aperturedefined within an opaque material. The system also comprises means forreceiving, at a first side of a waveguide, light transmitted through theaperture. The system also comprises means for guiding, by the waveguide,the received light toward a second side of the waveguide. The systemalso comprises means for detecting, at an array of light detectors,light propagating out of a third side of the waveguide. The third sideextends between the first side and the second side.

The foregoing summary is illustrative only and is not intended to be inany way limiting. In addition to the illustrative aspects, embodiments,and features described above, further aspects, embodiments, and featureswill become apparent by reference to the figures and the followingdetailed description.

BRIEF DESCRIPTION OF THE FIGURES

FIG. 1A is an illustration of a noise limiting system that includes anaperture, according to example embodiments.

FIG. 1B is another illustration of the system of FIG. 1A.

FIG. 2 is a simplified block diagram of a LIDAR device, according toexample embodiments.

FIG. 3A is an illustration of a noise limiting system that includes anaperture and a waveguide, according to example embodiments.

FIG. 3B illustrates a cross-section view of the system of FIG. 3A.

FIG. 4 illustrates a cross-section view of a waveguide coupled to amirror, according to example embodiments.

FIG. 5 illustrates a cross-section view of a waveguide that includes acladding layer having a plurality of deformations, according to exampleembodiments.

FIG. 6 illustrates a cross-section view of a waveguide that includes acladding layer having variably spaced deformations, according to exampleembodiments.

FIG. 7 is an illustration of a noise limiting system that includes anaperture and multiple waveguides, according to example embodiments.

FIG. 8 is a flowchart of a method, according to example embodiments.

DETAILED DESCRIPTION

Any example embodiment or feature described herein is not necessarily tobe construed as preferred or advantageous over other embodiments orfeatures. The example embodiments described herein are not meant to belimiting. It will be readily understood that certain aspects of thedisclosed implementations can be arranged and combined in a wide varietyof different configurations. Furthermore, the particular arrangementsshown in the figures should not be viewed as limiting. It should beunderstood that other implementations might include more or less of eachelement shown in a given figure. In addition, some of the illustratedelements may be combined or omitted. Similarly, an exampleimplementation may include elements that are not illustrated in thefigures.

I. Overview

Example implementations may relate to devices, systems, and methods forreducing background light imparted onto an array of light detectors. Thelight detectors in the array may be sensing light from a scene. Forexample, the light detectors may be a sensing component of a lightdetection and ranging (LIDAR) device.

One example system includes a lens. The lens may be used to focus lightfrom a scene. However, the lens may also focus background light notintended to be observed by the system (e.g., sunlight within the scene).In order to selectively filter the light (i.e., separate backgroundlight from light corresponding to information within the scene), anopaque material (e.g., selectively etched metal, a glass substratepartially covered by a mask, etc.) may be placed behind the lens. Theopaque material could be shaped as a slab, a sheet, or various othershapes in a variety of embodiments. Within the opaque material, anaperture may be defined. The aperture may select a region of, or theentirety of, the light of the scene focused by the lens for transmissionthrough the aperture.

On a backside of the opaque material (e.g., a side of the opaquematerial opposite another side on which focused light from the lens isprojected, etc.), the light selected by the aperture may be transmittedthrough the aperture. In the direction of propagation of the lighttransmitted through the aperture, the system may include a waveguidehaving a first side (e.g., adjacent to the aperture, etc.) and a secondside opposite to the first side. The system may also include an array oflight detectors (e.g., SPADs) disposed on or otherwise adjacent to athird side of the waveguide. For example, the third side may extend fromthe first side to the second side along a guiding direction in which thewaveguide guides propagation of light therein toward the second side.Thus, the array of light detectors may detect light that propagatesthrough the third side of the waveguide (e.g., evanescent light, and/orlight leaking through a cladding layer of the waveguide).

Because the light from the aperture is guided along a length of thewaveguide, the number of light detectors able to fit into a detectionarea (e.g., the third side) can be larger than could fit in across-sectional area of the aperture. This may be due to the light beingmore tightly focused, and thus have a smaller cross-sectional area, atthe aperture than along the third side of the waveguide. In someexamples, the system may also include a mirror (e.g., light reflector)disposed along the second side to reflect guided light arriving at thesecond side back into the waveguide. As a result, for instance, a largeramount of the light guided inside the waveguide may propagate out of thethird side and toward the array of light detectors.

In one example implementation, the system can employ frustrated totalinternal reflection (FTIR) to transmit a portion of the guided light inthe waveguide to the array of light detectors. For example, thewaveguide can be formed as a glass plate (or other material transparentto wavelength(s) of the guided light). The glass plate (i.e., waveguide)may also include a relatively low index of refraction (e.g., a polymercoating, fluorine-doped glass, etc.) cladding layer disposed on thethird side of the waveguide to facilitate FTIR of the guided light. Thecladding layer may include gaps (e.g., dents, etc.) to increase theamount of light escaping through the cladding layer at the positions ofthe gaps. Each gap can be aligned with a corresponding light detector inthe array such that light escaping from the gap can be detected by thecorresponding light detector. Thus, in this example, the waveguide maybe configured as a leaky waveguide in which light leaks out of the thirdside at positions corresponding to the light detectors. Further, in someinstances, separation distances between the gaps in the cladding layercan be gradually reduced as the light propagates toward the second side.As a result, a more uniform light intensity of the leaked light can beachieved.

In another example implementation, the system can employ scatteredcoupling to transmit light through the third side toward the lightdetectors in the array. For example, the waveguide can be implemented asa grating coupler that varies the strength of scattered light evanescingthrough the third side in a predetermined manner. Further, in someinstances, the system may also include a mirror disposed along a fourthside of the waveguide (opposite to the third side). By doing so, thewaveguide can be further configured as a wavelength filter by tuning theseparation distances along the grating structures on the third side.

Other example implementations are possible as well and are described ingreater detail within example embodiments herein.

II. Example Systems and Devices

FIG. 1A is an illustration of a noise limiting system 100 that includesan aperture, according to example embodiments. As shown, system 100includes an array 110 of light detectors (exemplified by detectors 112and 114), an aperture 122 defined within an opaque material 120, and alens 130. System 100 may measure light 102 scattered by an object 104within a scene. Light 102 may also come, at least partially, frombackground sources. Thus, in some examples, system 100 may be includedin a light detection and ranging (LIDAR) device. For example, the LIDARdevice may be used for navigation of an autonomous vehicle. Further, insome embodiments, system 100, or portions thereof, may be containedwithin an area that is unexposed to exterior light other than throughlens 130 and/or aperture 122. This may prevent ambient light fromtriggering the detectors in array 110 thereby affecting measurements.

Array 110 includes an arrangement of light detectors, exemplified bydetectors 112 and 114. In various embodiments, array 110 may havedifferent shapes. As shown, array 110 has a rectangular shape. However,in other embodiments, array 110 may be circular or may have a differentshape. The size of array 110 may be selected according to an expectedcross-sectional area of light 110 diverging from aperture 122, and maythus be based on the distance between array 110 and aperture 122,dimensions of aperture 122, optical characteristics of lens 130, etc. Insome embodiments, array 110 may be movable. For example, array 110 maybe actuated closer to, or further from, aperture 122. To that end, forinstance, array 110 could be mounted on an electrical stage capable oftranslating in one, two, or three dimensions.

Further, in some implementations, array 110 may provide one or moreoutputs to a computing device or logic circuitry. For example, amicroprocessor-equipped computing device may receive electrical signalsfrom array 110 which indicate an intensity of light 102 incident onarray 110. The computing device may then use the electrical signals todetermine information about object 104 (e.g., distance of object 104from aperture 122, etc.). In some embodiments, some or all of the lightdetectors within array 110 may be interconnected with one another inparallel. To that end, for example, array 110 may be an SiPM or an MPPC,depending on the particular arrangement and type of the light detectorswithin array 110. By connecting the the light detectors in a parallelcircuit configuration, for instance, the outputs from the lightdetectors can be combined to effectively increase a detection area inwhich a photon in light 102 can be detected (e.g., shaded region ofarray 110 shown in FIG. 1A).

Light detectors 112, 114, etc., may include various types of lightdetectors. In one example, detectors 112, 114, etc. include SPADs. SPADsmay employ avalanche breakdown within a reverse biased p-n junction(i.e., diode) to increase an output current for a given incidentillumination on the SPAD. Further, SPADs may be able to generatemultiple electron-hole pairs for a single incident photon. In anotherexample, light detectors 112, 114, etc., may include APDs. In someinstances, APDs or SPADs may be biased above an avalanche breakdownvoltage. Such a biasing condition may create a positive feedback loophaving a loop gain that is greater than one. Further, APDs or SPADsbiased above the threshold avalanche breakdown voltage may be singlephoton sensitive. In other examples, light detectors 112, 114, etc., mayinclude photoresistors, charge-coupled devices (CCDs), and/orphotovoltaic cells, among others.

In some implementations, array 110 may include more than one type oflight detector across the array. For example, array 110 can beconfigured to detect multiple predefined wavelengths of light 102. Tothat end, for instance, array 110 may comprise some SPADs that aresensitive to one range of wavelengths and other SPADs that are sensitiveto a different range of wavelengths. In some embodiments, lightdetectors 110 may be sensitive to wavelengths between 400 nm and 1.6 μm(visible and infrared wavelengths). Further, light detectors 110 mayhave various sizes and shapes within a given embodiment or acrossvarious embodiments. In some embodiments, light detectors 112, 114,etc., may include SPADs that have package sizes that are 1%, 0.1%, or0.01% of the area of array 110.

Opaque material 120 may block a portion of light 102 from the scene(e.g., background light) that is focused by the lens 130 from beingtransmitted to array 110. As such, opaque material 120 may be configuredto block certain background light that could adversely affect theaccuracy of a measurement performed by array 110. Opaque material 120,and therefore the aperture 122, may be positioned at or near a focalplane of the lens 130. In one example, opaque material 120 may blocktransmission by absorbing light 102. In another example, opaque material120 may block transmission by reflecting light 102. A non-exhaustivelist of example implementations of opaque material 120 includes anetched metal, a polymer substrate, a biaxially-oriented polyethyleneterephthalate (BoPET) sheet (also referred to as a Mylar® sheet), or aglass overlaid with an opaque mask, among other possibilities.

Aperture 122 provides a port within opaque material 120 through whichlight 102 may be transmitted. Aperture 122 may be defined within opaquematerial 120 in a variety of ways. In one example, where opaque material120 includes a metal, the metal may be etched to define aperture 122. Inanother example, where opaque material 120 is a glass substrate overlaidwith a mask, the mask may include a gap that defines aperture 122 (e.g.,via photolithography). In various embodiments, aperture 122 may bepartially or wholly transparent. For example, where opaque material 120is a glass substrate overlaid with a mask, aperture 122 may be definedas a portion of the glass substrate not covered by the mask, such thataperture 122 is not completely hollow but rather made of glass. Thus,for instance, aperture 122 may be nearly, but not entirely, transparentto one or more wavelengths of light 102 scattered by the object 104(because most glass substrates are not 100% transparent).

Aperture 122 (in conjunction with opaque material 120) may be configuredto spatially filter light 102 from the scene at the focal plane. Forexample, light 102 may be focused onto a focal plane along a surfaceopaque material 120, and aperture 122 may allow only a portion of thefocused light to be transmitted to array 110. As such, aperture 122 maybehave as an optical pinhole. In one embodiment, aperture 122 may have across-sectional area of between 0.02 mm² and 0.06 mm² (e.g., 0.04 mm²).In other embodiments, aperture 122 may have a different cross-sectionalarea depending on various factors such as optical characteristics oflens 130, distance to array 110, noise rejection characteristics of thelight detectors in array 110, etc.

Although the term “aperture” as used above with respect to aperture 122describes a recess or hole in an opaque material through which light maybe transmitted, it is noted that the term “aperture” may include a broadarray of optical features. In one example, as used throughout thedescription and claims, the term “aperture” may additionally encompasstransparent or translucent structures defined within an opaque materialthrough which light can be partially transmitted. In another example,the term “aperture” may describe a structure that otherwise selectivelylimits the passage of light (e.g., through reflection or refraction),such as a mirror surrounded by an opaque material. In one exampleembodiment, mirror arrays surrounded by an opaque material may bearranged to reflect light in a certain direction, thereby defining areflective portion. This reflective portion may be referred to as an“aperture”.

Although aperture 122 is shown to have a rectangular shape, it is notedthat aperture 122 can have a different shape, such as a round shape,circular shape, elliptical shape, among others. In some examples,aperture 122 can alternatively have an irregular shape specificallydesigned to account for optical aberrations within system 100. Forexample, a keyhole shaped aperture may assist in accounting for parallaxoccurring between an emitter (e.g., light source that emits light 102)and a receiver (e.g., lens 130 and array 110). The parallax may occur ifthe emitter and the receiver are not located at the same position, forexample. Other irregular aperture shapes are also possible, such asspecifically shaped apertures that correspond with particular objectsexpected to be within a particular scene or irregular apertures thatselect specific polarizations of light 102 (e.g., horizontalpolarizations or vertical polarizations).

Lens 130 may focus light 102 from the scene onto the focal plane whereaperture 122 is positioned. With this arrangement, the light intensitycollected from the scene, at lens 130, may be focused to have a reducedcross-sectional area over which light 102 is projected (i.e., increasingthe spatial power density of light 102). For example, lens 130 mayinclude a converging lens, a biconvex lens, and/or a spherical lens,among other examples. Alternatively, lens 130 can be implemented as aconsecutive set of lens positioned one after another (e.g., a biconvexlens that focuses light in a first direction and an additional biconvexlens that focuses light in a second direction). Other types of lensesand/or lens arrangements are also possible. In addition, system 100 mayinclude other optical elements (e.g., mirrors, etc.) positioned nearlens 130 to aid in focusing light 102 incident on lens 130 onto opaquematerial 120.

Object 104 may be any object positioned within a scene surroundingsystem 100. In implementations where system 100 is included in a LIDARdevice, object 104 may be illuminated by a LIDAR transmitter that emitslight 102 (or a portion thereof). In example embodiments where the LIDARdevice is used for navigation on an autonomous vehicle, object 104 maycomprise pedestrians, other vehicles, obstacles (e.g., trees), or roadsigns, among others.

As noted above, light 102 may be scattered by object 104, focused bylens 130, transmitted through aperture 122 in opaque material 120, andmeasured by light detectors in array 110. This sequence may occur (e.g.,in a LIDAR device) to determine information about object 104. In someembodiments, light 102 measured by array 110 may additionally oralternatively include light scattered off multiple objects, transmittedby a transmitter of another LIDAR device, ambient light, sunlight, amongother possibilities.

In addition, the wavelength(s) of light 102 used to analyze object 104may be selected based on the types of objects expected to be within ascene and their expected distance from lens 130. For example, if anobject expected to be within the scene absorbs all incoming light of 500nm wavelength, a wavelength other than 500 nm may be selected toilluminate object 104 and to be analyzed by system 100. The wavelengthof light 102 (e.g., if transmitted by a transmitter of a LIDAR device)may be associated with a source that generates light 102. For example,if the light is generated by a diode laser, light 102 may comprise lightwithin a wavelength range centered on 900 nm (or other wavelength of thediode laser). Thus, various types of light sources are possible forgenerating light 102 (e.g., an optical fiber amplifier, various types oflasers, a broadband source with a filter, etc.).

FIG. 1B is another illustration of system 100. As shown, system 100 mayalso include a filter 132. Filter 132 may include any optical filterconfigured to selectively transmit light within a predefined wavelengthrange. For example, filter 132 can be configured to selectively transmitlight within a visible wavelength range, an infrared wavelength range,or any other wavelength range of the light signal emitted by emitter140. For example, optical filter 132 may be configured to divert lightof particular wavelengths away from the array 110. For instance, opticalfilter 132 may divert a portion of light 102 that is not of thewavelength range emitted by emitter 140 away from array 110. Therefore,optical filter 132 may, at least partially, reduce ambient light orbackground light from adversely affecting measurements by array 110.

In various embodiments, optical filter 132 may be located in variouspositions relative to array 110. As shown, optical filter 132 is locatedbetween lens 130 and opaque material 120. However, optical filter 132may alternatively be located between lens 130 and object 104, betweenmaterial 120 and array 110, combined with array 110 (e.g., array 110 mayhave a surface screen that optical filter 132, or each of the lightdetectors in array 110 may individually be covered by a separate opticalfilter, etc.), combined with aperture 122 (e.g., aperture 122 may betransparent only to a particular wavelength range, etc.), or combinedwith lens 130 (e.g., surface screen disposed on lens 130, material oflens 130 transparent only to a particular wavelength range, etc.).

Further, as shown in FIG. 1B, system 100 could be used with an emitter140 that emits a light signal to be measured by array 110. Emitter 140may include a fiber laser, a photodiode, a filament, a LIDARtransmitter, or any other light source. As shown, emitter 140 may emitlight which is scattered by object 104 in the scene and ultimatelymeasured (at least a portion thereof) by array 110. In some embodiments,emitter 140 may be a laser emitter comprising an optical fiber amplifieror other amplifying system that increases power output of laser emitter140. Additionally or alternatively, in some embodiments, emitter 140 maybe implemented as a pulsed laser (as opposed to a continuous wavelaser), allowing for increased peak power while maintaining anequivalent continuous power output.

The following is a mathematical illustration comparing the amount ofbackground light that is received by lens 130 to the amount of signallight that is detected by the array 110. As shown, the distance betweenobject 104 and lens 130 is ‘d’, the distance between lens 130 and opaquematerial 120 is T, and the distance between the opaque material 120 andthe array 110 is ‘x’. As noted above, material 120 and aperture 122 maybe positioned at the focal plane of lens 130 (i.e., ‘f’ may beequivalent to the focal length). Further, as shown, emitter 140 islocated at a distance ‘d’ from object 104.

For the sake of example, it is assumed that object 104 is fullyilluminated by sunlight at normal incidence, where the sunlightrepresents a background light source. Further, it is assumed that allthe light that illuminates object 104 is scattered according toLambert's cosine law. In addition, it is assumed that all of the light(both background and signal) that reaches array 110 is fully detected byarray 110.

The power of the signal, emitted by emitter 140, that reaches aperture122, and thus array 110, can be calculated using the following:

$P_{signal} = {P_{tx} \times \Gamma \times \frac{A_{lens}}{\pi \; d^{2}}}$

where P_(signal) represents the radiant flux (e.g., in W) of the opticalsignal emitted by emitter 140 that reaches array 110, P_(tx) representsthe power (e.g., in W) transmitted by emitter 140, Γ represents thereflectivity of object 104 (e.g., taking into account Lambert's CosineLaw), and A_(lens) represents the cross-sectional area of lens 130.

The background light that reaches lens 130 can be calculated as follows:

${\overset{\_}{P}}_{background} = \frac{{\overset{\_}{P}}_{sun} \times T_{filter}}{\pi}$

where P _(background) represents the radiance

$\left( {{e.g.},{{in}\mspace{14mu} \frac{W}{m^{2} \cdot {sr}}}} \right)$

of the background light (caused by sunlight scattering off object 104)arriving on lens 130 that is within a wavelength band that will beselectively passed by filter 132, P _(sun) represents the irradiance

$\left( {{e.g.},{{in}\mspace{14mu} \frac{W}{m^{2}}}} \right)$

density due to the sun (i.e., the background source), and T_(filter)represents the transmission coefficient of filter 132 (e.g., a bandpassoptical filter). The factor of

$\frac{1}{\pi}$

relates to the assumption of Lambertian scattering off of object 104from normal incidence.

Aperture 122 reduces the amount of background light permitted to betransmitted to the array 110. To calculate the power of the backgroundlight that reaches array 110, after being transmitted through aperture122, the area of aperture 122 is taken into account. The cross-sectionalarea (A_(aperture)) of aperture 122 can be calculated as follows:

A _(aperture) =w×h

where A_(aperture) represents the surface area of aperture 122 relativeto object 104, and w and h represent the width and height (or length) ofaperture 122, respectively. In addition, if lens 130 is a circular lens,the cross-sectional area (A_(lens)) of lens 130 can be calculated asfollows:

$A_{lens} = {\pi \left( \frac{d_{lens}}{2} \right)}^{2}$

where d_(lens) represents the diameter of the lens.

Thus, the background power transmitted to array 110 through aperture 122can be calculated as follows:

$P_{background} = {{\overset{\_}{P}}_{background} \times \frac{A_{aperture}}{f^{2}} \times A_{lens}}$

where P_(background) represents background power incident on array 110,and

$\frac{A_{aperature}}{f^{2}}$

represents the acceptance solid angle in steradians. The above formulaindicates that P_(background) is the amount of radiance in thebackground signal after being reduced by lens 130 and aperture 122.

Substituting the above determined values in for P _(background),A_(aperture), and A_(lens) the following can be derived:

$P_{background} = {{\left( \frac{{\overset{\_}{P}}_{sun}T_{filter}}{\pi} \right) \times \left( \frac{wh}{f^{2}\;} \right) \times \left( {\pi \left( \frac{d_{lens}}{2} \right)}^{2} \right)} = {{\overset{\_}{P}}_{sun}T_{filter}{wh}\; \frac{d_{lens}^{2}}{4f^{2}}}}$

Additionally, the quantity

$F = \frac{f}{d_{lens}}$

may be referred to as the “F number” of lens 130. Thus, with one moresubstitution, the following can be deduced as the background power:

$P_{background} = \frac{{\overset{\_}{P}}_{sun}T_{filter}{wh}}{4F^{2}}$

Making similar substitutions, the following can be deduced for signalpower transmitted from the emitter 140 that arrives at the array 110:

$P_{signal} = {{P_{tx} \times \Gamma \times \frac{{\pi \left( \frac{d_{lens}}{2} \right)}^{2}}{\pi \; d^{2}}} = \frac{P_{tx}\Gamma \; d_{lens}^{2}}{4d^{2}}}$

Further, a signal to noise ratio (SNR) of system 100 may be determinedby comparing P_(signal) with P_(background). As demonstrated, thebackground power (P_(background)) may be significantly reduced withrespect to the signal power due to the inclusion of aperture 122,particularly for apertures having small w and/or small h (numerator ofP_(background) formula above). Besides reducing aperture area,increasing the transmitted power (P_(tx)) by emitter 140, decreasing thetransmission coefficient (T_(filter)) (i.e., reducing an amount ofbackground light that gets transmitted through the filter), andincreasing the reflectivity (F) of object 104 may be ways of increasingthe SNR. Further, it is noted that in implementations where emitter 140emits a pulsed signal, the shot noise of the background, as opposed tothe power of the background, may be primarily relevant when computingthe SNR. Thus, in some implementations, the SNR can be alternativelycomputed by comparing the shot noise against the signal power.

As shown in FIG. 1A, light 102 diverges as it propagates away fromaperture 122. Due to the divergence, a detection area at array 110(e.g., shown as shaded area illuminated by light 102) may be larger thana cross-sectional area of aperture 122 at the focal plane. An increaseddetection area (e.g., measured in m²) for a given light power (e.g.,measured in W) may lead to a reduced light intensity

$\left( {{e.g.},{{measured}\mspace{14mu} {in}\mspace{14mu} \frac{W}{m^{2}}}} \right)$

incident on array 110.

The reduction in light intensity may be particularly beneficial inembodiments where array 110 includes SPADs or other light detectorshaving high sensitivities. For example, SPADs derive their sensitivityfrom a large reverse-bias voltage that produces avalanche breakdownwithin a semiconductor. This avalanche breakdown can be triggered by theabsorption of a single photon, for example. Once a SPAD absorbs a singlephoton and the avalanche breakdown begins, the SPAD cannot detectadditional photons until the SPAD is quenched (e.g., by restoring thereverse-bias voltage). The time until the SPAD is quenched may bereferred to as the recovery time. If additional photons are arriving attime intervals approaching the recovery time (e.g., within a factor often), the SPAD may begin to saturate, and the measurements by the SPADmay thus become less reliable. By reducing the light power incident onany individual light detector (e.g., SPAD) within array 110, the lightdetectors (e.g., SPADs) in array 110 may remain unsaturated. As aresult, the light measurements by each individual SPAD may have anincreased accuracy.

FIG. 2 is a simplified block diagram of a LIDAR device 200, according toexample embodiments. In some example embodiments, LIDAR device 200 canbe mounted to a vehicle and employed to map a surrounding environment(e.g., the scene including object 204, etc.) of the vehicle. As shown,LIDAR device 200 includes a laser emitter 240 that may be similar toemitter 140. Further, as shown, LIDAR device 200 includes a controller250. Further, as shown, LIDAR device 200 includes a noise limitingsystem 290 that may be similar to system 100. For example, as shown,system 290 includes an array 210 of light detectors, an opaque material220 with an aperture defined therein (not shown), and a lens 230, whichare similar, respectively, to array 110, opaque material 120, and lens130. It is noted that LIDAR device 200 may alternatively include more orfewer components than those shown. For example, LIDAR device 200 mayinclude an optical filter (e.g., filter 132). Thus, system 290 can beimplemented similarly to system 100 and/or any other noise limitingsystem described herein. Device 200 may operate emitter 240 to emitlight 202 toward a scene that includes object 204. Device 200 may thendetect scattered light 202 to map or otherwise determine informationabout object 204.

Controller 250 may be configured to control components of LIDAR device200 and to analyze signals received from components of LIDAR device 200(e.g., array 210 of light detectors). To that end, controller 250 mayinclude one or more processors (e.g., a microprocessor, etc.) thatexecute instructions stored in a memory (not shown) of device 200 tooperate device 200. Additionally or alternatively, controller 250 mayinclude digital or analog circuitry wired to perform one or more of thevarious functions described herein.

In some implementations, controller 250 may use timing informationassociated with a signal measured by array 210 to determine a location(e.g., distance from LIDAR device 200) of object 204. For example, inembodiments where laser emitter 240 is a pulsed laser, controller 250can monitor timings of output light pulses and compare those timingswith timings of signal pulses measured by array 210. For instance,controller 250 can estimate a distance between device 200 and object 204based on the speed of light and the time of travel of the light pulse(which can be calculated by comparing the timings). In someimplementations, controller 250 may be configured to account forparallax (e.g., due to laser emitter 240 and lens 230 not being locatedat the same location in space). By accounting for the parallax,controller 250 can improve accuracy of the comparison between the timingof the output light pulses and the timing of the signal pulses measuredby the array 210.

In some implementations, controller 250 could modulate light 202 emittedby emitter 240. For example, controller 250 could change the projection(e.g., pointing) direction of emitter 240 (e.g., by actuating amechanical stage that mounts emitter 240). As another example,controller 250 could modulate the timing, the power, or the wavelengthof light 202 emitted by emitter 240. In some implementations, controller250 may also control other operational aspects of device 200, such asadding or removing filters (e.g., filter 132) along a path ofpropagation of light 202, adjusting relative positions of variouscomponents of device 200 (e.g., array 210, opaque material 220 (and anaperture therein), lens 230, etc.), among other possibilities.

In some implementations, controller 250 could also adjust an aperture(not shown) within material 220. For example, the aperture may, in someembodiments, be selectable from a number of apertures defined within theopaque material. In such embodiments, a MEMS mirror located between thelens and the opaque material may be adjustable by the computing deviceto determine to which of the multiple apertures the light is directed.In some embodiments, the various apertures may have different shapes andsizes. In still other embodiments, the aperture may be defined by aniris (or other type of diaphragm). The iris may be expanded orcontracted by controller 250, for example, to control the size or shapeof the aperture.

Thus, in some examples, LIDAR device 200 can modify a configuration ofsystem 290 to obtain additional or different information about object204 and/or the scene. In one example, controller 250 may select a largeraperture in response to a determination that background noise receivedby system from the scene is currently relatively low (e.g., duringnight-time). The larger aperture, for instance, may allow system 290 todetect a portion of light 202 that would otherwise be focused by lens130 outside the aperture. In another example, controller 250 may selecta different aperture position to intercept the portion of light 202. Inyet another example, controller 250 could adjust the distance (e.g.,distance ‘x’ shown in FIG. 1B) between the aperture and light detectorarray 210. By doing so, for instance, the cross-sectional area of adetection region in array 210 (i.e., cross-sectional area of light 202at array 210) can be adjusted as well (e.g., shaded region shown in FIG.1A).

However, in some scenarios, the extent to which the configuration ofsystem 290 can be modified may depend on various factors such as a sizeof LIDAR device 200 or system 290, among other factors. For example,referring back to FIG. 1A, a size of array 110 may depend on an extentof divergence of light 102 from a location of aperture 122 to a locationof array 110 (e.g., distance ‘x’ shown in FIG. 1B). Thus, for instance,the maximum vertical and horizontal extents of array 110 may depend onthe physical space available for accommodating system 100 within a LIDARdevice. Similarly, for instance, an available range of values fordistance ‘x’ (shown in FIG. 1B) between array 110 and aperture 122 mayalso be limited by physical limitations of a LIDAR device where system100 is employed.

Accordingly, example implementations are described herein for increasinga detection area in which light detectors can intercept light from thescene, while also reducing background noise and efficiently using spaceavailable for accommodating system 290.

FIG. 3A is an illustration of a noise limiting system 300 that includesan aperture and a waveguide, according to example embodiments. FIG. 3Billustrates a cross-section view of system 300, according to exampleembodiments. In some implementations, system 300 can be used with device200 instead of or in addition to system 290. As shown, system 300 maymeasure light 302 scattered by an object 304 within a scene similarlyto, respectively, system 100, light 102, and object 104. Further, asshown, system 300 includes a light detector array 310, an opaquematerial 320, an aperture 322, and a lens 330 which may be similar,respectively, to array 110, material 120, aperture 122, and lens 130.For the sake of example, aperture 322 is shown to have a different shape(elliptical) compared to a shape of aperture 122 (rectangular). Asshown, system 300 also includes a waveguide 360 (e.g., opticalwaveguide, etc.) arranged to receive light 302 (or a portion thereof)transmitted through aperture 322 and projected onto (e.g., shadedregion) a receiving side 360 a of waveguide 360.

Waveguide 360 can be formed from a glass substrate (e.g., glass plate,etc.) or any other material at least partially transparent to one ormore wavelengths of light 302. In some examples, as shown, waveguide 360may be proximally positioned and/or in contact with opaque material 320such that light 302 transmitted through aperture 322 is projected ontoreceiving side 360 a (e.g., input end) of waveguide 360. Waveguide 360may then guide at least a portion of received light 302, via totalinternal reflection or frustrated total internal reflection (FTIR) forinstance, inside waveguide 360 toward another end of waveguide 360. Forexample, where waveguide 360 is a rectangular waveguide as shown,waveguide 360 can guide received light 302 toward side 360 b opposite toside 360 a.

As shown, for instance, waveguide 360 may extend vertically betweensides 360 c and 360 d. To that end, sides 360 c and 360 d may correspondto interfaces between a relatively high index of refraction medium(e.g., glass, etc.) of waveguide 360 and a relatively lower index ofrefraction medium (e.g., air, vacuum, etc.) adjacent to sides 360 c and360 d. Thus, for instance, if guided light 302 propagates to side 360 cat less than the critical angle (e.g., which may be based on a ratio ofindexes of refractions adjacent to side 360 c, etc.), then the guidedlight incident on side 360 c (or a portion thereof) may be reflectedback into waveguide 360. Similarly, as shown, waveguide 360 may extendhorizontally between side 360 e and another side of waveguide 360 (notshown) opposite to side 360 e to reduce divergence of the guided lighthorizontally, for example.

Further, as shown, light portions 302 a, 302 b, 302 c of light 302 maypropagate out of side 360 c extending along a guiding direction ofwaveguide 360 (e.g., between sides 360 a and 360 b). In one example,guided light portions 302 a, 302 b, 302 c may correspond to anevanescent field of light evanescing through side 360 c. In thisexample, evanescent light 302 a, 302 b, 302 c may leak out of waveguide360 for various reasons. For instance, light portions 302 a, 302 b, 302c may correspond to light arriving at side 360 c at an angle greaterthan the critical angle. As a result, guided light portions 302 a, 302b, 302 c may thus escape waveguide 360 rather than reflect (e.g., viatotal internal reflection) back into waveguide 360. In another example,waveguide 360 may comprise deformations (e.g., dents, etc.) along asurface of side 360 c that allow light portions 302 a, 302 b, 302 c topropagate out of waveguide 360, while causing a remaining portion ofguided light 302 to continue propagating toward side 360 b.

Thus, unlike light detector array 110, light detector array 310 can bepositioned (as shown) along the guiding direction of waveguide 360(e.g., adjacent to side 360 c) to intercept and/or detect light portions302 a, 302 b, 302 c propagating out of side 360 c. Through this process,system 300 may provide an increased detection area for interceptinglight 302 while also efficiently utilizing the space behind opaquematerial 320.

It is noted that the sizes, positions, and shapes of the variouscomponents and features shown in FIGS. 3A and 3B are not necessarily toscale, but are illustrated as shown for convenience in description.Further, in some embodiments, system 300 may include fewer or morecomponents than those shown. Further, in some embodiments, one or moreof the components shown can be combined, or divided into separatecomponents.

In a first embodiment, light detector array 310 can be alternativelydisposed (e.g., molded, etc.) on side 360 c.

In a second embodiment, a distance between waveguide 360 and aperture322 can vary. In one example, as shown, waveguide 360 can be disposedalong (e.g., in contact with, etc.) opaque material 320. Thus, forinstance, side 360 a (i.e., input end of waveguide 360) can besubstantially coplanar with or proximal to aperture 322. With thisarrangement for instance, waveguide 360 can receive and guide light 302prior to divergence of light 302 transmitted through aperture 302.However, in other examples, waveguide 360 can be alternativelypositioned at a distance (e.g., gap) from opaque material 320 (andaperture 322).

In a third embodiment, the arrangement of aperture 322 (and/or side 360a of waveguide 360) relative to lens 330 can vary.

In one example, aperture 322 (and/or an input end of waveguide 360) canbe disposed along the focal plane of lens 330.

In another example, aperture 322 (and/or an input end of waveguide 360)can be disposed parallel to the focal plane of lens 330 but at adifferent distance to lens 330 than the distance between the focal planeand lens 330. Thus, in this example, optical characteristics (e.g.,focus configuration, etc.) of system 300 can be adjusted depending on anapplication of system 300. As such, in some instances, focused light 302may continue converging (after transmission through aperture 322) insidewaveguide 360 before beginning to diverge toward side 360 b. In someinstances, system 300 may also include an actuator that moves lens 330,opaque material 320, and/or waveguide 360 to achieve a particularoptical configuration while scanning the scene.

In yet another example, aperture 322 (and/or side 360 a of waveguide360) can be arranged at an offset orientation relative to the focalplane of lens 330. For instance, system 300 can rotate (e.g., via anactuator) opaque material 320 (and/or array 360) to adjust the entryangle of light 302 into waveguide 360. By doing so, a controller (e.g.,controller 250) can further control optical characteristics of system300 depending on various factors such as lens characteristics of lens330, environment of system 300 (e.g., to reduce noise / interferencearriving from a particular region of the scanned scene, etc.), amongother factors.

In a fourth embodiment, material 320 can be omitted and side 360 a canbe alternatively positioned along or parallel to the focal plane of lens330. In this embodiment, side 360 a may thus correspond to an aperture.

In a fifth embodiment, the light detectors in array 310 can bealternatively implemented as separate physical structures coupled (e.g.,disposed on or molded to, etc.) to waveguide 360.

In a sixth embodiment, light detector array 310 can be implemented toalternatively or additionally overlap other sides of waveguide 360(e.g., side 360 e, side 360 d, etc.). Thus, in this embodiment, thelight detectors in array 310 can detect light leaking out of waveguide360 over an even greater detection area.

In a seventh embodiment, waveguide 360 can alternatively have acylindrical shape, such as an optical fiber. In this embodiment, thelight detectors in array 360 can be alternatively arranged to surroundan outer surface of the optical fiber to detect light portions 302 a,302 b, 302 c, etc., evanescing or otherwise leaking out of thecylindrical outer surface of the optical fiber. Thus, in variousembodiments, waveguide 360 can be implemented as a rigid structure(e.g., slab waveguide) or as a flexible structure (e.g., optical fiber).

In line with the discussion above, for example, waveguide 360 can beconfigured as a waveguide diffuser that diffuses light 302 (or a portionthereof) transmitted through aperture 322 into a detection area that canhave various shapes or positions, as opposed to a flat surface (e.g.,shaded region shown in FIG. 1A) orthogonal to a direction of propagationof diverging light 102.

FIG. 4 illustrates a waveguide 460 coupled to a mirror 470, according toexample embodiments. Waveguide 460 may be similar to waveguide 360.Thus, for example, waveguide 460 can be used in system 300 instead of orin addition to waveguide 360. To that end, light 402, light portions 402a, 402 b, 402 c, and sides 460 a, 460 b, 460 c, 460 d may be similar,respectively, to light 302, light portions 302 a, 302 b, 302 c, andsides 360 a, 360 b, 360 c, 360 d.

Mirror 470 may comprise any reflective material that reflects lightpropagating out of side 460 b back into waveguide 460. As a result, forinstance, light that did not diffuse through side 460 c can be returnedback into waveguide 460 to further increase the likelihood of diffusiontoward light detectors (not shown) adjacent to side 460 c.

As shown, waveguide 460 includes a core region 462 that is partiallysurrounded by a cladding layer 464. Core region 462 may comprise arelatively high index of refraction material, such as a glass substratefor instance, that is transparent to at least some wavelengths of light302. Cladding layer 464 may comprise a relatively low index ofrefraction material, such as polymer coated or fluorine doped glasssubstrates for instance. In some examples, waveguide 360 can be formedfrom a glass substrate that includes doped regions corresponding tocladding layer 464. Thus, regions of the glass substrate that are notdoped may correspond to core 462.

As shown, cladding layer 464 is disposed on side 460 d but not on side460 c. With this arrangement, for instance, diffusing light portions 402a, 402 b, 402 c may be more likely to exit waveguide 460 through side460 c relative to side 460 d. For example, the presence of claddinglayer 464 may cause the critical angle for light incident on aninterface between core 462 and cladding 464 to be greater than acorresponding critical angle at side 460 c. As a result, a greaterextent of guided light inside waveguide 460 may diffuse out of side 460c toward light detectors (not shown), such as the light detectors inarray 310 of system 300 for example.

In some examples, cladding layer 464 can extend along other sides ofwaveguide 460 in addition to or instead of side 460 d. Referring back toFIGS. 3A and 3B for example, a cladding layer may be configured tosurround waveguide 360 along sides 360 e and a side of waveguide 360opposite to side 360 e (not shown). With this arrangement, for instance,diffusion of light portions 402 a, 402 b, 402 c through side 460 c canbe further improved relative to other sides that are surrounded bycladding 464.

To enhance diffusion of light portions 402 a, 402 b, 402 c through side460 c, in some implementations, a texture of a surface of side 460 c canadditionally or alternatively have a greater roughness than other sides(e.g., side 460 d) of waveguide 460. Thus, for example, waveguide 460can be implemented as a rough waveguide having a pseudorandom roughsurface 460 c. Alternatively or additionally, in some examples, thesurface of side 460 c can have scattering features (e.g., dents,indentations, etc.) positioned in predefined locations that overlap withlight detectors (not shown). In these examples, the scattering featuresmay increase the likelihood of diffusion of light portions 402 a, 402 b,402 c, at particular locations where corresponding light detectors arepositioned.

In some implementations, it may be desirable to include a cladding layerat side 460 c as well. For example, as a length of waveguide 460 betweensides 460 a and 460 b increases, more of guided light 402 may exit froma region of side 460 c closer to side 460 a than a region of side 460 ccloser to side 460 b.

Accordingly, FIG. 5 illustrates a cross-section view of a waveguide 560that includes a cladding layer 564 having a plurality of deformations566, 567, 568, according to example embodiments. Waveguide 560 may besimilar to waveguide 360. Thus, for example, waveguide 560 can be usedin system 300 instead of or in addition to waveguide 360. To that end,diverging light 502, light portions 502 a, 502 b, 502 c, and sides 560a, 560 b, 560 c, 560 d may be similar, respectively, to diverging light302, light portions 302 a, 302 b, 302 c, and sides 360 a, 360 b, 360 c,360 d. Further, waveguide 560 includes a core 562 and a cladding layer564 that may be similar, respectively, to core 452 and cladding layer464.

As shown, unlike waveguide 460, cladding layer 564 extends over side 560c from which light portions 502 a, 502 b, 502 c diffuse out of waveguide560. Various configurations are possible for deformations 566, 567, 568.In one example, deformations 566, 567, 568 may correspond to removed,thinned, and/or otherwise distorted portions of cladding layer 564. Tothat end, deformations 566, 567, 568 may be formed using varioustechniques such as mechanical friction (e.g., sandpaper, etc.),machining, etching, etc. In another example, deformations 566, 567, 568may correspond to materials having a same or higher index of refractionas core 562. For example, deformations 566, 567, 568 may include a samepolymer as core region 562 or another polymer having a similar (orhigher) index of refraction. In yet another example, the deformations566, 567, 568 may correspond to regions of cladding layer 564 having asmaller thickness than other areas of the cladding layer 564.

Regardless of the implementation, light portions 502 a, 502 b, 502 c mayexit waveguide 560 via, respectively, deformations 566, 567, 568 due tothe higher index of refraction in these regions. In turn, for example,light detectors (not shown) can be aligned with deformations 566, 567,568 to detect diffusing light portions 502 a, 502 b, 502 c. Forinstance, each light detector can be disposed in contact with orproximate to a deformation. Further, for example, the presence ofcladding layer 564 between deformations 566, 567, 568 may cause more ofthe guided light inside waveguide 560 to continue propagating towardside 560 b.

In an alternative implementation, although not shown, deformations 566,567, 568 can be alternatively implemented as regions of cladding layer564 that have a smaller thickness compared to other regions that are notaligned with a light detector. In yet another alternativeimplementation, although not shown, the thickness of core 562 can bealternatively reduced in regions that overlap respective lightdetectors. Regardless of the implementation, frustrated total internalreflection (FTIR) may occur at the locations of deformations 566, 567,568 due to the index of refraction distortions at these locations.

As a result of the deformations and the cladding layer in waveguide 560,guided light 502 can diffuse over a relatively larger surface area ofside 560 c compared to a surface area of side 460 c of waveguide 460from which guided light 402 diffuses.

FIG. 6 illustrates a waveguide 660 that includes a cladding layer 664having a plurality of variably spaced deformations, exemplified bydeformations 666, 667, 668, according to example embodiments. Waveguide660 may be similar to waveguide 560. Thus, for example, waveguide 660can be used in system 300 instead of or in addition to waveguide 360. Tothat end, diverging light 602, light portions 602 a, 602 b, 602 c, sides660 a, 660 b, 660 c, 660 d, core 662, cladding 664, and deformations666, 667, 668 may be similar, respectively, to diverging light 502,light portions 502 a, 502 b, 502 c, sides 560 a, 560 b, 560 c, 560 d,core 562, and cladding 564.

However, unlike deformations 566, 567, 568 of waveguide 560,deformations 666, 667, 668 may be variably spaced along cladding layer664. By doing so, for instance, waveguide 660 can enhance uniformity oflight portions 602 a, 602 b, 602 c propagating out of deformations 666,667, 668, and/or increase a region of side 660 c (e.g., lengthwisebetween sides 660 a and 660 b) through which the guided light continuesto diffuse out of waveguide 660.

In an example scenario, light portion 602 c propagating out ofdeformation 668 may have a lower amount, intensity, brightness, etc.,than light portion 602 a propagating out of deformation 666. Suchdiscrepancy may be caused by various factors. For example, an amount oflight 602 a propagating out of deformation 666 may be greater due todeformation 666 being closer to side 660 a. As guided light 602propagates toward side 660 b, for instance, less of the guided light mayremain for diffusion through deformation 668 due to diffusion ofportions of guided light 602 via successive deformations in waveguide660. Accordingly, in some examples, deformations 666, 667, 668, etc.,can be variably spaced to provide a more uniform intensity of diffusedlight portions 602 a, 602 b, 602 c. For example, as shown in FIG. 6, adistance between deformations 667 and 668 may be smaller than a distancebetween deformations 666 and 667. The diffused light portions 602 a, 602b, 602 c could be intercepted by light detectors (not shown), such asthe light detectors in array 310.

Additionally, in some examples, the distance between adjacentdeformations may be based on a given distance from the adjacentdeformations to side 660 a. For example, the distance between adjacentdeformations in waveguide 660 could be gradually reduced depending onhow far the deformations are from side 660 a.

Alternatively or additionally, the distances between adjacentdeformations in waveguide 660 can be selected according to an expectedwavelength of light 602. For example, where light 602 comprises lightpulses emitted by a LIDAR laser emitter (e.g., emitter 240), the spacingbetween deformations 666, 667, 668, etc., can be selected such thatwaveguide 660 is configured as a grating coupler that selects particularwavelengths for diffusion via the deformations toward respective lightdetectors. To facilitate this, in some implementations, the thickness ofcladding 664 can also be predefined to enhance constructive interferenceof the light having the selected wavelength(s). Additionally, althoughnot shown, a mirror (similar to mirror 470) can be arranged adjacent toside 660 d to reflect evanescing light escaping through cladding 664back into waveguide 660, thereby further improving constructiveinterference.

Referring back to FIG. 2, in some scenarios, it may be desirable toobtain additional information from multiple apertures (or a largeaperture) simultaneously with the information obtained using the currentaperture configuration, while still achieving a target SNR. By way ofexample, a light pulse emitted by emitter 240 could be scattered offseveral objects at different distances to LIDAR device 200, and aportion of the scattered light may thus be focused, via lens 230, onto aregion of opaque material 220 outside the current aperture. Therefore,referring back to FIG. 1A for instance, it may be desirable to detectlight focused onto a region adjacent to aperture 122 whilesimultaneously detecting light focused onto aperture 122. However, if anadditional aperture is positioned adjacent to aperture 122 (or the sizeof aperture 122 is increased), the diverging light from the additionalaperture may overlap with diverging light 102 prior to arrival at array110, thereby reducing the SNR of the detected signal.

FIG. 7 is an illustration of a noise limiting system 700 that includesan aperture and multiple waveguides, according to example embodiments.System 700 may be similar to system 300, for example. To that end, alens 730 may focus light 702 into an aperture 722 defined within opaquematerial 720 similarly to, respectively, lens 330, light 302, aperture322, and opaque material 320. Thus, light 702 may be transmitted throughaperture 722. Further, system 700 includes light detector arrays 710,712, and 714 that are each similar to array 310. For example, array 710may include a plurality of light detectors (not shown) that areconnected in parallel to one another (e.g., parallel circuitconfiguration) to provide a combined output indicative of light portion702 a incident on array 710. Similarly, for example, array 712 mayinclude another plurality of connected light detectors that interceptlight portion 702 b, and array 714 may include yet another plurality ofconnected light detectors that intercept light 702 c.

Unlike system 300 however, as shown, system 700 includes multiplewaveguides 760, 762, 764 arranged behind opaque material 720 to receivethe respective portions of diverging light 702. Thus, for example,waveguide 760 may receive a first portion of light 702 at side 760 a andguide the received portion toward an opposite side 760 b of waveguide760. Some of the guided light can be diffused through side 760 c(extending between sides 760 a and 760 b along a guiding direction ofwaveguide 760) as light 702 a that can then be intercepted and detectedby light detectors in array 710. Similarly, for example, waveguide 762can receive a second portion of light 702 at side 762 a and guide thesecond portion toward an opposite side 762 b of waveguide 762. Some ofthe guided light can thus be diffused through side 762 c as light 702 bthat can be intercepted and detected by light detectors in array 712.Similarly, for example, waveguide 764 can receive a third portion oflight 702 at side 764 a and guide the third portion toward an oppositeside 764 b of waveguide 764. Some of the guided light can thus bediffused through side 764 c as light 702 c that can be intercepted anddetected by light detectors in array 714.

Thus, with this arrangement, system 700 can allow detection of lightpropagating through smaller adjacent apertures (i.e., corresponding toportions of aperture 722) simultaneously over relatively largerdetection areas, while preventing overlap between the light from therespective adjacent apertures. To facilitate this, as shown, each pairof adjacent waveguides may extend away from one another along therespective guiding directions of receiving waveguides. For example, asshown, waveguide 760 extends away from waveguide 762 and waveguide 764extends away from waveguide 762.

Although input ends 760 a, 762 a, 764 a of waveguides 760, 762, 764 areshown to have a similar size, in some examples, input ends 760 a, 762 a,764 a may have different sizes relative to one another. By way ofexample, input end 762 a of waveguide 762 may have a greater size thaninput end 760 a of waveguide 760. In this example, due to the differencebetween the cross-sectional areas of respective portions of light 702incident on respective waveguides 760 and 762, light 702 b detected atarray 712 may represent a larger angular field-of-view (FOV) of thescanned scene relative to an angular FOV indicated by light 702 a andincident on light detector 710.

In some examples, to prevent cross-talk between the waveguides, eachwaveguide may be configured to begin diffusing light onto a respectivelight detector array at a location where adjacent waveguides aresufficiently separated. For example, waveguide 760 may comprise cladding(e.g., cladding 464), and the cladding may not include any deformationsuntil waveguide 760 bends away (e.g., based on a curvature of curvedside 760 c) from waveguide 762 to provide a sufficient separationdistance to reduce or prevent leakage of guided light between waveguides760 and 762.

In some examples, system 700 may also include absorber layer(s) (e.g.,carbon black, black chrome, etc.) positioned (not shown) between thevarious waveguides to further prevent potential cross-talk between theadjacent waveguides. For example, an absorber layer may absorbevanescing light or other light propagating between the adjacentwaveguides (e.g., cladding modes of light propagating inside a waveguidecladding).

Thus, system 700 may allow for multi-pixel imaging of the sceneindicated by diverging light 702 transmitted through aperture 722, whilealso reducing background noise since only a small respective portion ofthe light (and its associated background noise) are guided by eachwaveguide. For example, as shown, combined outputs from light detectorsin array 710 may correspond to a first pixel that indicates lighttransmitted through a first lengthwise portion of aperture 722, combinedoutputs from light detectors in array 712 may correspond to a secondpixel that indicates light transmitted through a second lengthwiseportion of aperture 722, and combined outputs from light detectors inarray 714 may correspond to a third pixel that indicates lighttransmitted through a third lengthwise portion of aperture 722. As such,for example, controller 250 of device 200 can compute a one-dimensional(1D) image (e.g., vertically in a lengthwise direction of aperture 722)of the scene by combining the three pixels.

However, it is noted that system 700 can alternatively include more orfewer waveguides to generate a 1D image with more or fewer pixels.Further, although waveguides 760, 762, 764 are shown in a lengthwise(e.g., vertical) arrangement relative to aperture 722, in some examples,system 700 may include waveguides in a different arrangement. In oneexample, the receiving sides (e.g., 760 a, 762 a, 764 a) of thewaveguides can alternatively be arranged horizontally (e.g., along adirection perpendicular to the page) to obtain a horizontal 1D image ofthe scene. In another example, the receiving sides of the waveguides canalternatively be arranged both horizontally and vertically (e.g., as atwo-dimensional grid) adjacent to aperture 722. Thus, in this example,controller 250 can combine outputs from the waveguides to generate atwo-dimensional (2D) image of the scene.

III. Example Methods and Computer Readable Media

FIG. 8 is a flowchart of a method 800, according to example embodiments.Method 800 presents an embodiment of a method that could be used withany of systems 100, 300, 700, device 200, and/or waveguides 460, 560,and 660, for example. Method 800 may include one or more operations,functions, or actions as illustrated by one or more of blocks 802-810.Although the blocks are illustrated in a sequential order, these blocksmay in some instances be performed in parallel, and/or in a differentorder than those described herein. Also, the various blocks may becombined into fewer blocks, divided into additional blocks, and/orremoved based upon the desired implementation.

In addition, for method 800 and other processes and methods disclosedherein, the flowchart shows functionality and operation of one possibleimplementation of present embodiments. In this regard, each block mayrepresent a module, a segment, a portion of a manufacturing or operationprocess, or a portion of program code, which includes one or moreinstructions executable by a processor for implementing specific logicalfunctions or steps in the process. The program code may be stored on anytype of computer readable medium, for example, such as a storage deviceincluding a disk or hard drive. The computer readable medium may includea non-transitory computer readable medium, for example, such ascomputer-readable media that stores data for short periods of time likeregister memory, processor cache and Random Access Memory (RAM). Thecomputer readable medium may also include non-transitory media, such assecondary or persistent long term storage, like read only memory (ROM),optical or magnetic disks, compact-disc read only memory (CD-ROM), forexample. The computer readable media may also be any other volatile ornon-volatile storage systems. The computer readable medium may beconsidered a computer readable storage medium, for example, or atangible storage device. In addition, for method 800 and other processesand methods disclosed herein, each block in FIG. 8 may representcircuitry that is wired to perform the specific logical functions in theprocess.

At block 802, method 800 involves focusing, by a lens (e.g., lens 130)disposed relative to a scene, light from the scene. In some examples,the light from the scene may be scattered by an object (e.g., object104) within the scene. In some examples, a computing device (e.g.,controller 250) may actuate or otherwise adjust a characteristic of thelens (e.g., focal plane, focal length, etc.). At block 804, method 800involves transmitting the focused light through an aperture (e.g.,aperture 322) defined within an opaque material (e.g., opaque material120). At block 806, method 800 involves receiving, at a first side(e.g., side 360 a) of a waveguide, at least a portion of the lighttransmitted through the aperture. At block 808, method 800 involvesguiding, by the waveguide, the received light toward a second side ofthe waveguide (e.g., side 360 b). At block 810, method 800 involvesdetecting light propagating out of a third side (e.g., side 360 c, etc.)extending between the first side and the second side.

The above detailed description describes various features and functionsof the disclosed systems, devices, and methods with reference to theaccompanying figures. While various aspects and embodiments have beendisclosed herein, other aspects and embodiments will be apparent. Thevarious aspects and embodiments disclosed herein are for purposes ofillustration only and are not intended to be limiting, with the truescope being indicated by the following claims.

1-20. (canceled)
 21. A system comprising: a lens; a waveguide; anaperture defined within an opaque material, wherein the aperture isdisposed between the lens and the waveguide, wherein the lens isconfigured to focus light from a scene into the aperture such thatdiverging light is transmitted out of the aperture toward the waveguide,wherein the waveguide is configured to guide light from a first side toa second side by total internal reflection or frustrated total internalreflection such that at least a portion of the guided light propagatesout of the waveguide between the first side and the second side; and anarray of light detectors that intercepts and detects at least a portionof the diverging light.
 22. The system of claim 21, wherein the array oflight detectors comprises a plurality of single photon avalanche diodes(SPADs).
 23. The system of claim 21, wherein the light detectors in thearray are connected in parallel with one another.
 24. The system ofclaim 21, wherein the array of light detectors comprises a siliconphotomultiplier (SiPM).
 25. The system of claim 21, further comprising amirror coupled to the waveguide between the first side and the secondside.
 26. The system of claim 21, wherein the waveguide has one or moredeformations between the first side and the second side, and wherein theone or more deformations cause at least a portion of the guided light topropagate out of the waveguide.
 27. The system of claim 21, wherein thewaveguide has one or more indentations between the first side and thesecond side, and wherein the one or more indentations cause at least aportion of the guided light to propagate out of the waveguide.
 28. Thesystem of claim 21, further comprising: one or more additionalwaveguides, wherein each additional waveguide is configured to guidelight from a respective first side to a respective second side by totalinternal reflection or frustrated total internal reflection such that atleast a portion of the guided light propagates out of the additionalwaveguide between the respective first side and the respective secondside.
 29. The system of claim 28, wherein each additional waveguideincludes a respective curved portion.
 30. The system of claim 21,further comprising: one or more additional arrays of light detectors.31. A light detection and ranging (LIDAR) device, comprising: a LIDARtransmitter that illuminates a scene; and a LIDAR receiver that receiveslight scattered by one or more objects within the scene, wherein theLIDAR receiver comprises: a lens; a waveguide; an aperture definedwithin an opaque material, wherein the aperture is disposed between thelens and the waveguide, wherein the lens is configured to focus lightfrom the scene into the aperture such that diverging light istransmitted out of the aperture toward the waveguide, wherein thewaveguide is configured to guide light from a first side to a secondside by total internal reflection or frustrated total internalreflection such that at least a portion of the guided light propagatesout of the waveguide between the first side and the second side; and anarray of light detectors that intercepts and detects at least a portionof the diverging light.
 32. The LIDAR device of claim 31, wherein thearray of light detectors comprises a plurality of single photonavalanche diodes (SPADs).
 33. The LIDAR device of claim 31, wherein thelight detectors in the array are connected in parallel with one another.34. The LIDAR device of claim 31, wherein the array of light detectorscomprises a silicon photomultiplier (SiPM).
 35. The LIDAR device ofclaim 31, wherein the LIDAR receiver further comprises a mirror coupledto the waveguide between the first side and the second side.
 36. TheLIDAR device of claim 31, wherein the waveguide has one or moredeformations between the first side and the second side, and wherein theone or more deformations cause at least a portion of the guided light topropagate out of the waveguide.
 37. The LIDAR device of claim 31,wherein the waveguide has one or more indentations between the firstside and the second side, and wherein the one or more indentations causeat least a portion of the guided light to propagate out of thewaveguide.
 38. The LIDAR device of claim 31, wherein the LIDAR receiverfurther comprises: one or more additional waveguides, wherein eachadditional waveguide is configured to guide light from a respectivefirst side to a respective second side by total internal reflection orfrustrated total internal reflection such that at least a portion of theguided light propagates out of the additional waveguide between therespective first side and the respective second side.
 39. The LIDARdevice of claim 38, wherein each additional waveguide includes arespective curved portion.
 40. The LIDAR device of claim 31, wherein theLIDAR receiver further comprises: one or more additional arrays of lightdetectors.